Matching Properties of Deep Sub-Micron MOS Transistors
Jeroen A. Croon
- 24 maart 2005
- 9780387243146
Samenvatting:
The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter.
The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
€ 153,-
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